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 Ultra-Wideband Source , UWS-1000


July 7, 2004

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Combination of a novel stable short-pulse light source and a super-continuum light generation technology demonstrates an ultra-wideband output spectrum at wavelength 1200 nm to 2000 nm at a signal output power of more than -30 dBm/nm . Optical output is available from single mode fiber (core diameter 10 micro-meter). The fully computer-controlled light source; UWS-1000 is easy-to use for many optical applications at maintenance free. The new product is a result of successful collaborative research with University of Tokyo.


Excellent spectral stability
    ¡À0.03dB¡¡typ.

Excellent focusing characteristics
    as a laser source

Output signal power¡¡-30 dBm/nm
    £¨@1200nm ¡« 2000 nm£©

Fully computer-controlled &
    Maintenance free
Emission spectrum of the UWS-1000



Table 1¡¡Specifications of the UWS-1000
Category Parameter unit Min Max
Spectral Characteristics Optical Spectrum Range μm 1.2 2.0
Spectral Power Density dBm/nm -30
Optical Spectral Stability dB ±0.1
Repetition Rate MHz 6.0±0.5
Interface Optical Connector - FC
Optical Faber - SMF
Dimensions Width x Height x depth mm 443x132x400
Warranty - 1 year






Ultra-Wideband Source UWS-1000 has excellent advantages of the wideband
characteristics of a white lamp and focusing properties of a laser.





Ultra-Wideband Source UWS-1000 can contribute a variety of optical industries.





Output spectra of UWS-1000 and other sources




Spectral stability of the UWS-1000, measurement time 15 Min, £ÀTemp£º25¡À1 degC.
Spectral stability of +/-0.03 dB has been achieved.


Applications

 AR Coating Characterization
The UWS-1000 can be used to measure ultra-low reflectivity anti-reflection (AR) coatings. Conventional methods using white light sources are limited to measurements down to 0.1% (-30dB). The UWS-1000 can successfully measure down to 0.0001% (-60dB). The system provides a rapid measurement and with a finely focused beam can be used to generate a 2D reflectivity profile with < 10μm resolution.
AR Coating Reflectance



 CWDM Filter Characterization
The light source can be used to measure the optical characteristics of CWDM filters. The wavelength range covers the standard 8 channel CWDM wavelengths with the flexibility to include the full 16 channel wavelength range down to 1300nm or less if required.
Transmission Characteristics
Reflection Characteristics



 PON Filter Characterization
The light source can be used to measure the characteristics of optical filters for passive optical networks (PON). The ultra-wide bandwidth is particularly useful and enables the characterization of the 1310nm , 1490nm and 1550nm wavelength bands in a single measurement.
Transmission Characteristics
Reflection Characteristics



 Optical Coherence Tomography  :  using UWS-1000G (santec)
Gaussian shape spectrum of the UWS-1000G.
Center wavelength 1300 nm, spectral width 250nm, optical power 2mW
A coherent length of less than 4 micro-meter has been achieved.