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快速扫描可调激光器, Swept-X
October 2002
产品介绍
到目前为止，基于可调激光器的光谱分析系统的扫描速度和精度尚未达到生产测试环境的要求。在此，Santec愉快地介绍我们的扫描激光系统，它能在令人吃惊的2.5秒时间内完成40nm宽度的扫描。众所周知，如果用此产品作光谱测量可以得到最佳的分辨率。激光波长的精确控制稳定性可以达到1
picometer的测量分辨率。波长和功率计的结合使得Swept-X用一个单元就能完成无源器件性能的快速和精确测量。
Until now tunable laser based spectral measurement systems have
not achieved the speeds and accuracy necessary for the manufacturing
testing environment. Santec is pleased to introduce a swept laser
system that tunes through 40 nm in an astonishing 2.5 seconds. It
is well known that when it comes to spectral measurements that lasers
offer the best resolution available. Precise control of laser wavelength
and stability results in a measurement resolution of 1-picometer.
Integrated wavelength and power meters make the SweptX the one unit
you'll need for speedy and accurate measurement of passive optical
component performance.
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