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E-Newsletter [Tunable Laser’s application note for Silicon Photonics]

June 3, 2014
FAST and ACCURATE characterization of Silicon Photonic Devices!
 

Swept Test System

The Santec Swept Test System is designed for high-resolution (< pm), high-speed measurement of optical WDL/PDL.

A proprietary rescaling technique enables sub picometer resolution measurement during wavelength scans of up to 40nm/s. The system is particularly suited to transmission spectra characterization such as that required for Hi Q Photonic Devices. Rapid sweep and accurate measurement is time saving and ensures the integrity/validity of your device characterization for academic presentation.

 

Features

  • Accurate WDL/PDL characteristics measurement
  • Reduced measurement time
  • High wavelength resolution & accuracy
  • Automatic normalization of laser source power
  • Measurement system can be built easily with any basic power meter
  • Suitable for High Q photonic crystals or silicon photonic device

 

Measurement Diagram (High Q cavity devices)

DUT: Ultra-high Q cavities / Keio University supported

SweptTestSystem-Brochure 362kb

 

Novel photonic devices [1-12] are of great interest for the photonics research community. Basic characterization of transmission spectra is key in the development of new devices. Santec TSL-510 is the narrow line-width tunable external cavity laser that provides the solution for such measurement. The recently introduced swept test system STS-510 incorporates our 5th generation tunable laser, TSL-510, with a digitizer board and dedicated software. The STS-510 realizes rapid continuous sweep while taking spectral data in sub picometer resolution calibrated in wavelength and power.

 

References (The references below used santec TSL series tunable lasers for their device characterization)

1.T. Asano, B.S. Song, Y.Akahane, and S. Noda, “Ultrahigh-Q Nanocavities in Two-Dimensional Photonic Crystal Slabs,” IEEE J OF Selected Topics in Quantum Electronics, Vol12, No. 6, Nov/Dec 2006

2.T. Asano, BS.Song, and S.Noda , “Analysis of the experimental Q factors (~ 1 million) of photonic crystal nanocavities,” Optics Express, Vol. 14, Issue 5, pp. 1996-2002 (2006)

3.T. Asatsuma, T. Baba , “Aberration reduction and unique light focusing in a photonic crystal negative refractive lens,”Vol. 16, No. 12 / OPTICS EXPRESS 8711(2008)

4.H. Y. Fu, et al. “Novel fiber optic polarimetric torsion sensor based on polarizationmaintaining photonic crystal fiber,” Proc. of SPIE Vol. 7004, 70042V, (2008)

5.ZG-Yan, Z. Qiang, CK-Yu, Z. Wei and HY-Dong ,” Time-Domain Measurement of Optical True-Time Delay in Two-Dimensional Photonic Crystal Waveguides “Chinese Physics Letters Vol. 27, No.11 2010

6.H. Y. Fu, et al., and C. Lu,” Polarization-maintaining photonic-crystal-fiber-based all-optical polarimetric torsion sensor,” 15954 APPLIED OPTICS / Vol. 49, No. 31 / 1 Nov.(2010)

7.J. Caro, et al. ,”Transmission measurement of the photonic band gap of GaN photonic crystal slabs,” Appl. Phys. Lett. 93, 051117 (2008)

8.Veronica Toccafondo, et al. ” DNA Detection Using a Photonic Crystal Waveguide Sensor,” Optical Sensors (Sensors) Karlsruhe, Germany, June 21, 2010 Biophotonics and Fiber-Sensors

9.K.Knabe,et al. ”Stability of an Acetylene Frequency Reference inside Kagome Structured Hollow-Core Photonic Crystal Fiber,” Conference on Lasers and Electro-Optics (CLEO) Baltimore, Maryland May 31, (2009)

10.A. Kroetch, et al., “Fabrication of Nonlinear Optical Devices in Ionic Self-Assembled Multilayers,” J. Micro/Nanolithography, MEMS, and MOEMS 8, 013011:1-11 (2009).

11.Q. Vy, et al.,”Photonic crystal membrane waveguides with low insertion losses,” Appl. Phys. Lett. 95, 061105 (2009)

12.C.Y. Ngo, et al.,“Electroabsorption Characteristics of Single-Mode 1.3- \mu m InAs–InGaAs–GaAs Ten-Layer Quantum-Dot Waveguide,” J of Photonics Tech. Letters, Vol.22, 1717 – 1719 Dec.1, (2010)